NaN / 0
Precious Metal Analyzer Gold X-Ray xrf Fluorescence Spectrometer For Metal Analysis
Get Latest Price
US$ 62000
≥1 Sets
US$ 50000
≥1000 Sets
Quick Details
Warranty:
1year
Size:
550-450-395mm
Weight:
55kg
Place of Origin:
Henan, China
Product Details
High Precision Energy Dispersive X-Ray Fluorescence Spectrometer
Product Description
Introduction:
1 Restriction of hazardous substances contained in products with environmental regulations, such as the face in the field of electrical and electronic equipment targeted at the RoHS directive, to the automotive sector targeted ELV directive, to the field of children's toys and other objects EN71 instruction, not only in Europe but also in increasing stringent worldwide.
2 NanbeiI’s XD-8010, analysis speed quickly, high accuracy and good reproducibility of the sample
3 Without damage, do not pollute the environment. These technical advantages can easily solve these limitations instructions.
Applications:
Quality and Technical Supervision(Environmental directives)
RoHS/Rohs (China)/ELF/EN71
Toy
Paper, ceramics, paint, metal,etc.
Electrical and Electronic Materials
Semiconductors, magnetic materials, soldering, electronic parts, etc.
Iron and steel, non-ferrous metals
Alloys, precious metal, slag, ores,etc.
Chemical industry
Mineral products, chemical fiber, catalysts, coatings, paints,cosmetics, etc.
Environment
Soil, food, industrial waste, coal powder
Oil
Oil, lubricating oil, heavy oil, polymer, etc.
Others
Coating thickness measurement, coal, archeology, materials research and forensic etc.
Product Feature
1 Three different types of X-ray radiation safety systems, software interlocks,
hardware interlocks, and mechanical interlocks, will completely eliminate radiation
leakage under any working condition.
2 The XD-8010 features a uniquely designed optical path that minimizes distances
between the X-ray source, sample, and detector while maintaining the flexibility to
switch between a variety of filters and collimators. This significantly improves the
sensitivity, and lowers the detection limit.
3 The large volume sample chamber allows large samples to be directly analyzed
without the need for damage or pre-treatment.
4 Simple, one-button analysis using a convenient and intuitive software interface.
5 Professional training is not required to perform basic operation of the instrument.
6 The XD-8010 provides rapid elemental analysis of elements from S to U, with
adjustable analysis times.
7 Up to 15 combinations of filters and collimators. Filters of various thicknesses and
materials are available, as well as collimators ranging from Φ1 mm to Φ7 mm.
8 The powerful report formatting feature allows for flexible customization of the
automatically generated analysis reports. The generated reports can be saved in PDF
and Excel formats. The analysis data is automatically stored after each analysis.
9 Historical data and statistics can be accessed at any time from a simple query
interface.
10 Using the instrument's sample camera, you can observe the position of the sample
relative to the focus of the X-ray source. Pictures of the sample are taken when
analysis begins and can be displayed in the analysis report.
11 The software's spectra comparison tool is useful for qualitative analysis and material
identification and comparison.
12 By using proven and effective methods of qualitative and quantitative analysis, the
accuracy of the results can be assured.
13 The open and flexible calibration curve fitting feature is useful for a variety of
applications such as the detection of harmful substances.
Spectrogram Overlap
Analysis Method of Harmful Element and Quality Management Process
•Harmful element analysis method
|
Hazardous Substances |
Example |
|
|
Screening Analysis |
Detailed analysis |
|
|
Hg |
X-ray spectroscopy |
AAS |
|
Pb |
||
|
Cd |
||
|
Cr6+ |
X-ray spectroscopy (Analysis of total Cr) |
Ion chromatography |
|
PBBs / PBDEs |
X-ray spectroscopy (Analysis of total Br) |
GC-MS |
Note: PBBs / PBDEs only for RoHS Instruction Analysis
•Quality Management Process
Noted:XRF X-Ray fluorescence method AAS atomic absorption method
Application Examples
Measurement of harmful trace element in polyethylene samples, such as Cr, Br, Cd, Hg and Pb.
• The difference of given values and the actual values of Cr, Br, Cd, Hg and Pb.
The difference of given values and the actual values of Cr, (Unit: ppm)
|
Sample |
Given Value |
Actual Value (XD-8010) |
|
Blank |
0 |
0 |
|
Sample 1 |
97.3 |
97.4 |
|
Sample 2 |
288 |
309.8 |
|
Sample 3 |
1122 |
1107.6 |
The difference of given values and the actual values of Br, (Unit: ppm)
|
Sample |
Given Value |
Actual Value (XD-8010) |
|
Blank |
0 |
0 |
|
Sample 1 |
90 |
89.7 |
|
Sample 2 |
280 |
281.3 |
|
Sample 3 |
1116 |
1114.1 |
The difference of given values and the actual values of Cd, (Unit: ppm)
|
Sample |
Given Value |
Actual Value (XD-8010) |
|
Blank |
0 |
0 |
|
Sample 1 |
8.7 |
9.8 |
|
Sample 2 |
26.7 |
23.8 |
|
Sample 3 |
107 |
107.5 |
The difference of given values and the actual values og Hg, (Unit: ppm)
|
Sample |
Given Value |
Actual Value (XD-8010) |
|
Blank |
0 |
0 |
|
Sample 1 |
91.5 |
87.5 |
|
Sample 2 |
271 |
283.5 |
|
Sample 3 |
1096 |
1089.5 |
The difference of given values and the actual values of Pb, (Unit: ppm)
|
Sample |
Given Value |
Actual Value (XD-8010) |
|
Blank |
0 |
0 |
|
Sample 1 |
93.1 |
91.4 |
|
Sample 2 |
276 |
283.9 |
|
Sample 3 |
1122 |
1120.3 |
The repeated measurement data of sample 3 Cr1122ppm, Br116ppm, Cd10ppm, Hg1096ppm, Pb1122ppm (Unit: ppm)
|
Cr |
Br |
Cd |
Hg |
Pb |
|
|
1 |
1128.7 |
1118.9 |
110.4 |
1079.5 |
1109.4 |
|
2 |
1126.2 |
1119.5 |
110.8 |
1072.4 |
1131.8 |
|
3 |
1111.5 |
1115.5 |
115.8 |
1068.9 |
1099.5 |
|
4 |
1122.1 |
1119.9 |
110.3 |
1086.0 |
1103.0 |
|
5 |
1115.6 |
1123.6 |
103.9 |
1080.7 |
1114.8 |
|
6 |
1136.6 |
1113.2 |
101.2 |
1068.8 |
1103.6 |
|
7 |
1129.5 |
1112.4 |
105.3 |
1079.0 |
1108.0 |
|
Average |
1124.3 |
1117.6 |
108.2 |
1076.5 |
1110.0 |
|
Standard deviation |
8.61 |
4.03 |
4.99 |
6.54 |
10.82 |
|
RSD |
0.77% |
0.36% |
4.62% |
0.61% |
0.98% |
• Secondary filter for Pb element (Steel substrate samples), Sample: Steel (Pb 113ppm)
Working Principle
1.X-ray radiation from the primary X-ray tube, is irradiated through a collimator to the sample.
2.Primary X-ray excitation characteristics of the elements contained in the sample X-rays through the secondary collimator into the detector
3.Processed through the detector, forming fluorescence spectroscopy data
4.Computer spectroscopy data analysis, qualitative and quantitative analysis is completed
Technical Parameters
|
Model |
XD-8010 |
|
|
Analysis principle |
Energy dispersive X-ray fluorescence analysis |
|
|
Elements Range |
S (16) – U (92) any element |
|
|
Sample |
Plastic / metal / film / solid / liquid / powder, etc., any size and irregular shape |
|
|
X - ray tube |
Target |
Mo |
|
Tube voltage |
(5-50)kV |
|
|
Tube current |
(10-1000)uA |
|
|
Sample irradiation diameter |
F1mm-F7mm |
|
|
Filter |
15 sets of composite filter is automatically selected, and the automatic conversion |
|
|
Detector |
Imports from the United States Si-PIN detector |
|
|
The data processing circuit board |
Imports from the United States, with the use of Si-PIN detector sets |
|
|
Sample observation |
With 300,000-pixel CCD camera |
|
|
The sample chamber size |
490 (L)´430 (W)´150 (H) |
|
|
Analysis method |
Linear linear, quadratic Code lines, strength and concentration calibration correction |
|
|
Operating system software |
Windows XP, Windows7 |
|
|
Data management |
Excel data management, test reports, PDF / Excel format saved |
|
|
Working environment |
Temperature: £30°C. Humidity£70% |
|
|
Weight |
55kg |
|
|
Dimensions |
550´450´395 |
|
|
Power supply |
AC220V±10%,50/60Hz |
|
|
Determination conditions |
Atmospheric environment |
|
Packaging & Shipping
Related Products
30%
Hot Searches